BGO Array
Bismuth Germanate, BGO (Bi₄Ge₃O₁₂), is one of the most widely used oxide scintillation materials. It boasts stable physical and chemical properties, robust mechanical strength, high density, a high refractive index, and exceptional resistance to harsh environments. Thanks to its immense stopping power, high scintillation efficiency, excellent energy resolution, and non-hygroscopic nature, BGO serves as an ideal scintillator for a broad spectrum of applications across high-energy physics, space physics, nuclear medicine, geological exploration, and other demanding industries.At Atr Crystal, we manufacture bespoke BGO arrays tailored to our customers' precise design requirements, accommodating specific pixel sizes, total pixel counts, reflector materials, and crystal surface finishes. We provide a diverse range of design configurations and reflector options to perfectly optimize array performance for your exact application. Our rigorous manufacturing process guarantees high light output, outstanding pixel-to-pixel uniformity, and minimal optical crosstalk. Furthermore, custom offset BGO arrays (multilayer configurations) are readily available upon request.
Product Category:
Pixellated Array
Applications of BGO Array
1 ) Positron emission tomography (PET)
2 ) High-energy physics
3 ) Nuclear medicine
4 ) Geological exploration
5 ) Gamma-ray spectroscopy
Advantages of BGO Array
1 ) High Z
2 ) Good photopeak to Compton ratio
3 ) The scintillator of choice for neutron activation analysis and active Compton shields
4 ) High density
Specifications of BGO Array
1 ) Number of pixels: 4×4; 8×8; 16×16; 24×24; 30×30 etc. (customized upon request)
2 ) Minimal pixel size: 0.2 mm x 0.2 mm
| Reflector Types and Thicknesses of BGO Array | |
| Material | Thickness of reflector material + adhesive |
| BaSO4 | ≥0.1 mm |
| ESR | 0.08 mm |
| E60 | 0.075 mm |
| TiO2 | ≥0.1 mm |
| Properties of BGO Crystal | |
| Density [g/cm3] | 7.13 |
| Melting point [K] | 1323 |
| Thermal expansion coefficient [C-1] | 7 x 10-6 |
| Cleavage plane | None |
| Hardness (Mho) | 5 |
| Hygroscopic | No |
| The wavelength of emission max. [nm] | 480 |
| Refractive index @ emission max | 2.15 |
| Primary decay time [ns] | 300 |
| Light yield [photons/keVγ] | 8-10 |
| Photoelectron yield [% of NaI(Tl)] (for γ-rays) | 15–20 |
| Afterglow | 0.005%@3ms |
Quality Control for LYSO(Ce) Array
1 ) Dimension testing
2 ) Relative light output testing
3 ) Pixel light output uniformity: ≤10%；≤20%；≤30% or on request
4 ) Energy resolution testing
5 ) Scatter Map
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